Abstract

This article describes the design of a 1.24-pJ/b 112-Gb/s PAM4 transceiver test chip in 7-nm FinFET for in-package die-to-die communication. The receiver supports 0–1.2-V input common mode and utilizes a single-stage active inductor-based CMOS continuous-time linear equalizer (CTLE) with 12 data slicers and two error slicers. The quad-rate voltage-mode transmitter implements delay-based sub-UI two-tap FFE and digital I/Q and DCC clock calibration. A single-phase clock from a wideband <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">LC</i> phase-locked loop (PLL) is distributed to eight transceiver channels. In each channel, an injection-locked oscillator (ILO) generates eight-phase clocks that feed an 8-bit CMOS phase interpolator (PI). The transceiver achieves < 1e <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">−12</sup> bit error rate (BER) over 30-mm channel at 106.25 Gb/s and over 20-mm channel at 112 Gb/s.

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