Abstract
In this article, a new metal-semiconductor field-effect transistor (MESFET) is introduced by amending the carrier distribution in the active regions of the device for radio frequency applications (RF). A quasi-two-dimensional material beta gallium oxide ( ${\beta }$ -Ga2O3) semiconductor is used as a fundamental material. To amend the carrier distribution, a tunnel diode (TD- ${\beta }$ GO) is employed at the bottom of the source and the channel regions in the buried oxide (BOX) layer of MESFET. In our work, parameters such as the breakdown voltage, the self-heating effect, the kink effect, the parasitic capacitance, the power gains, the noise figure, and the carrier’s concentration are obtained and compared with the conventional structure. As a result of employing the tunnel diode, the TD- ${\beta }$ GO MESFET has better characteristics in comparison with the C- ${\beta }$ GO MESFET though the drain current at the saturation region in the TD- ${\beta }$ GO structure is reduced.
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More From: IEEE Transactions on Device and Materials Reliability
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