Abstract
Pulse thermography has been developed by several researchers as one of effective quantitative thermographic NDT techniques. The interest of the researchers has been focused on how to process transient temperature data after pulse heating to conduct successful identification of defect parameters such as its depth, shape and size. In this paper, a new data processing technique based on the wavelet transform is proposed. When a pulse heat flux is applied to the surface of material containing a defect inside, characteristic temperature change is observed on the surface due to the heat insulation effect of the defect. Especially defect depth influences the time profile of the transient temperature change after pulse heating. In this study, numerical analyses are conducted to obtain a calibration relation between defect parameters and coefficients calculated from wavelet transform of the transient temperature change.
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