Abstract
Display front‐of‐screen (FOS) quality inspection is essential for the mass production of displays in the manufacturing process. However, the severe imbalanced data, especially the limited number of defective samples, has been a long‐standing problem that hinders the successful application of deep learning algorithms. Synthetic defect data generation can help address this issue. This paper reviews the state‐of‐the‐art synthetic data generation methods and the evaluation metrics that can potentially be applied to display FOS quality inspection tasks.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
