67‐3: Numerical Simulation for GaN‐based MicroLED Laser Induced Forward Transfer (LIFT) and Comparison With Real‐Time Measurements of the Flight Phase

Abstract

The use of pulsed UV laser systems to manipulate MicroLEDs is enabling the development and production of MicroLED displays. For this purpose, modeling and numerical simulations are useful as they offer an insight into the process that is impossible to achieve by process diagnostic methods alone. The multi‐physics and non‐linear radiation‐material interactions that occur in laser processing of MicroLEDs can be evaluated, visualized, and brought into line with the observed processing results. We present our most current attempts to do real‐time measurements during the flight phase as well as findings in numerical simulation of MicroLED LIFT.