Abstract
ER characteristic in smecticA phase of a liquid crystal have been investigated utilizing a parallel-plate type rheometer. Since the smectic liquid crystal has a solid like property which is controllable with the electric field and temperature conditions, the strength of the structure in the SmecticA phase is experimentally examined from the change in yield stress under various conditions. It is found that the yield stress was depending on the current type of the electric field and the frequency of AC electric field. Moreover, the yield stress is only dependent on the electric field condition when the Smectic structure is grown, and the yield stress, i.e. the structure generated, is hardly changed by changing the electric field after. Larger yield stress is obtained with a rough surface of the electrode.
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