Abstract

Arithmetic Logic Unit (ALU) is an integral part of digital signal processing applications and computing systems. We used ALU, based on Kogge-Stone adder, as a reference circuit to experimentally validate the advanced design flow and the dual RSFQ/ERSFQ standard cell library. Using the advanced design flow, the ALU sub-blocks were optimized across multiple process corners using Monte-Carlo simulations incorporating statistical variations in the process parameters. The correct operation of ALU was verified in the digital HDL simulation using static timing analysis pre-fabrication. We designed the RSFQ 1-bit and 4-bit ALU using the standard cell library approach for MIT-LL 100 µA/µm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> SFQ5ee fab node. For the ERSFQ 1-bit ALU, the bias current overhead for the feeding JTLs was designed to be 100% of the ERSFQ DUT bias current. The RSFQ 1-bit ALU, designed for low frequency functional testing, demonstrated greater than ±15% bias margins. We demonstrated successful operation of the RSFQ 4-bit ALU with greater than ±6% bias margins at 20 GHz, greater than ±5% bias margins at 40 GHz, and greater than ±4% bias margins at 50 GHz clock frequency with BER less than 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-12</sup> . The ERSFQ 1-bit ALU worked up to 30.72 GHz clock frequency with BER less than 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-12</sup> . In addition, we analyzed the model-to-hardware correlation for the INIT sub-block of the ALU. The simulations accounted for critical current density ( <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">J<sub>c</sub></i> ) and sheet resistance ( <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>s</sub></i> ) process parameters. We noted the discrepancy in simulated and measured margins and studied that a 15% higher <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">J<sub>c</sub></i> in simulations results in better model-to-hardware correlation for the INIT sub-block.

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