Abstract

AbstractThe goal of development effort for an AMLCD display in IBM is to provide a customer with a best display in terms of image quality, features for EMI reduction, low power dissipation, and also mechanical packaging. In order to achieve this goal, properties of column driver play important roles. A simple and unique method was developed to examine those properties at device level. and the result showed good consistency with actual performance of column driver on an AMLCD display. Characterization of column driver with this methods results in a time‐efficient and cost‐effective comparing to a conventional evaluation purpose only prototyping.

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