Abstract
AbstractReducing LCD substrate thickness from 0.7 mm to 0.5 mm improves edge‐light mura from glass thermal‐stress birefringence by 26%. Sub nanometer (nm) resolution retardation measurements were performed on 1.1, 0.7, 0.5, 0.4, 0.3, and 0.1 mm thick substrates of width 482 mm and a height of 305 mm with an LCD edge‐light and are in good agreement with the stress optic law.
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