Abstract
The automotive display system requires high reliability to the longterm usage and the wide operation temperature range. The performance of the display system relies on the characteristics of a‐Si:H transistors in the driver circuit. We here propose the new a‐Si:H integrated gate driver circuit, where the self‐compensation transistors are intentionally added to stabilize the bias conditions at the extreme environment. The additional pull‐down transistors, only operating at low temperatures, compensate the decreased oncurrent of the circuit at the extreme condition. This consequently improves the reliability of the output characteristics for the display system.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
