3%Si-Fe合金の1次再結晶板の{110}方位粒分布と2次再結晶粒方位の関係

Abstract

In an attempt to clarify the mechanism of secondary recrystallization in 3%Si-Fe, the orientation relationship between the secondary Goss grains and the matrix texture and the Goss nucleus in the primary texture was investigated utillizing X-ray (vector method) and SEM-ECC-ECP technique. The main results obtained are as follows.(1) The largest grain present in the surface of primary recrystallized specimen was not a Goss oriented grain and the frequency peak of Goss oriented grains deviated about 0.035 rad from the rolling direction when processed by the one-stage cold rolling method. The intensity peak of Goss grains was situated within 0.087 rad from the rolling direction when processed by the two-stage cold rolling method.(2) The frequency distribution of Σ9 coincidence grains corresponding to Goss grains rotated about ND axis has a peak value at an ideal Goss orientation in the primary matrix processed by the one-stage cold rolling method, while no peak value was recognized at the ideal Goss orientation when processed by the two-stage cold rolling method.(3) The frequency distribution of Goss secondaries has a peak value at an ideal Goss orientation. However, in the two-stage cold rolling process, a peak value is situated between 0.09 and 0.18 rad apart from an ideal Goss orientation.(4) It can be concluded from the above findings that the distribution of coincidence boundaries rather than the size and the frequency of Goss grains in the primary texture mainly determines the sharpness of Goss secondaries in the grain oriented silicon steel processed both by the one- and two-stage cold rolling methods.