Abstract
The goal of this paper is to present a diagnosis method for bridging faults combining three different data sources: I/sub DDQ/ measurements, logical behavior and layout parasitic capacitances. The resulting hybrid method constitutes a significant improvement over an existing one based on probabilistic signatures. Combining these data contributes to reduce the number of potential fault sites to consider in the diagnosis process, and therefore accelerate this process. Simulation results show that the number of potential bridging fault sites is reduced from 0.5N(N-1) to less than N, where N is the number of nodes in the circuit under test.
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