Abstract
Focal plane detector array technology in the infrared wave band is expensive or underdeveloped, and the detection efficiency is low, while single-pixel imaging (SPI) offers better performance, such as ultrafast time response and high quantum efficiency in wide wave bands. Therefore, SPI technology can be used for infrared imaging. In this work, a near-infrared raster scan SPI system is proposed. By means of a grating to modulate height information of objects, we can further achieve three-dimensional imaging in the framework of Fourier transform profilometry. The proposed approach is demonstrated with experiments at the wavelength of 1064 nm.
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