Abstract
Conventional research in structured light measurements has utilized light intensity as a channel for information. The polarization of light can be used as an additional channel of information. In this paper, a method based on the superposition of multiple polarization states is proposed to encode structured light. By building a polarization model between the color of light and the polarization states, polarized structured light containing phase information is obtained without rotating the polarizer. It is demonstrated that the method improves the waveform quality of stripes and the accuracy of the 3D reconstruction results when measuring highly reflective objects.
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