3D micromagnetic model of finite linear defects in antiferromagnetically coupled multilayers

Abstract

A 3D micromagnetic model for the study of the influence of finite linear structural defects on the remagnetization processes in antiferromagnetically coupled multilayers is presented (such defects are assumed to induce the local ferromagnetic coupling between adjacent magnetic layers). Some new features of 360°-domain walls predicted by the previous model where the defect was assumed to be infinitely long are observed. It is shown that the annihilation field of such walls strongly depends on the defect configuration, whereas the wall width is determined by the parameters of the undisturbed layer only. Consequences for the comparison of our results with experimental data are drawn.