3D Inspection by Registration of CT and Dual X-ray Images

Abstract

Computed tomography (CT) can completely digitize the interior and the exterior of nearly any object without any destruction. Generally, the resolution for industrial CT is below a few microns. The industrial CT scanning, however, has a limitation because it requires long measuring and processing time. Whereas, 2D X-ray imaging is fast. In this paper, we propose a novel concept of 3D non-destructive inspection technique using the advantages of both micro-CT and dual X-ray images. After registering the master object’s CT data and the sample objects’ dual X-ray images, 3D non-destructive inspection is possible by analyzing the matching results. Calculation for the registration is accelerated by parallel computing using graphics processing unit (GPU).