Abstract
Yttrium segregation behavior in Al-Si alloys has been studied using the three-dimensional atom probe tomography technique. Al-Si alloys were prepared by casting method, and yttrium was added to modify the eutectic silicon morphology in these alloys. The results indicated that yttrium is preferentially located within the Si phase, with the highest concentration at the interface between eutectic Al and eutectic Si.
Highlights
Aluminum-silicon (Al-Si) alloys are widely used in automotive and aerospace industries due to their high strength-to-weight ratio, good castability, and excellent mechanical and performance properties.[1]
The ductility and tensile strength of these alloys can be improved by addition of modifying elements such as sodium, strontium, and rareearth elements, which modify the eutectic silicon morphology from flake to fibrous shape.[1,2,3]
Atom probe tomography (APT) has been used by several researchers to look into the segregation of the modifying element within Al-Si alloys.[7,8,9,10,11,12]
Summary
Aluminum-silicon (Al-Si) alloys are widely used in automotive and aerospace industries due to their high strength-to-weight ratio, good castability, and excellent mechanical and performance properties.[1] The microstructure of eutectic and hypoeutectic AlSi is very coarse, with the eutectic being made up of large platelets or needles of silicon in a continuous aluminum matrix. Alloys exhibiting this microstructure show poor ductility due to the large and brittle silicon plates. In the work presented for the first time, the segregation behavior of yttrium in Al-Si alloy was studied using atom probe tomography; the results obtained from this study are presented and discussed
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
