Abstract
Praseodymium‐doped indium zinc oxide (PrIZO) has been employed as the channel layer of thin film transistors (TFTs). The TFTs with Pr doping exhibit a remarkable suppression of the light induced instability. A negligible photo‐response and remarkable enhancement in negative gate bias stress under illumination (NIBS) are achieved in the PrIZO TFTs. Meanwhile, the PrIZO TFTs show reasonable characteristics with a high field effect mobility of 26.3 cm2/Vs, SS value of 0.28V/decade, and Ion/Ioff ratio of 109. A prototype of fully transparent AMOLED display is successfully fabricated to demonstrate the potential of Pr‐doping TFTs applied in transparent devices. The G4.5 target of PrIZO has been fabricated for the future mass production.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
