Abstract
AbstractThick dielectric electroluminescent displays are tolerant of particle‐related defects introduced during fabrication processes compared to TFT‐LCD displays. Early experimental trials have shown that displays can have a high incidence of particle‐related defects and that a small percentage of the defects had an adverse effect on display performance or image quality. Defects introduced at different steps in the fabrication process have been characterized and their impact on the projected manufacturing yield for the displays assessed. Characterization was carried out using electrical and optical measurement techniques.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
