Abstract

This work presents a surface analytical study of the corrosion inhibitor 2-phenylimidazole (2PhI) adsorbed on a Cu surface from 3 wt.% NaCl solution. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) were used to investigate the surface phenomena. Various XPS experiments were performed, i.e., survey- and angle-resolved high-resolution XPS spectra measurements, gas cluster ion beam sputtering in conjunction with XPS measurements, and XPS imaging in conjunction with principal component analysis. These measurements were used to detail the composition of the surface layer at depth. In addition, various ToF-SIMS experiments were performed, such as positive ion ToF-SIMS spectral measurements, ToF-SIMS imaging, and cooling/heating in conjunction with ToF-SIMS measurements. This study shows that organometallic complexes were formed between 2PhI molecules and Cu ions, that the surface layer contained entrapped NaCl, that the surface layer contained some Cu(II) species (but the majority of species were Cu(I)-containing species), that the surface was almost completely covered with a combination of 2PhI molecules and organometallic complex, and that the temperature stability of these species increases when 2PhI is included in the organometallic complex.

Highlights

  • The use of a corrosion inhibitor is a very convenient method to mitigate corrosion, especially for closed systems

  • This study shows that organometallic complexes were formed between 2PhI molecules and Cu ions, that the surface layer contained entrapped NaCl, that the surface layer contained some Cu(II) species (but the majority of species were Cu(I)-containing species), that the surface was almost completely covered with a combination of 2PhI molecules and organometallic complex, and that the temperature stability of these species increases when 2PhI is included in the organometallic complex

  • In order to adsorb 2PhI molecules on the surface for the X-ray photoelectron spectroscopy (XPS) and ToF-SIMS analyses, the Cu samples were immersed for 1 h in 3 wt.% NaCl solution containing 1 mM of 2PhI

Read more

Summary

Introduction

The use of a corrosion inhibitor is a very convenient method to mitigate corrosion, especially for closed systems. The manner in which corrosion inhibitors bond to the surface is critical in determining whether they can effectively mitigate corrosion. The latter can be investigated using surface analytical techniques, in particular X-ray photoelectron spectroscopy (XPS) and time-offlight secondary ion mass spectrometry (ToF-SIMS) [22,23,24,25,26,27,28]. The manner of 2PhI bonding on Cu was investigated to explain the mechanism of surface adsorption and the formation of the protective surface layer, which is crucial for a corrosion inhibitory effect [36,37,38]. Molecular-specific signals were measured by time-of-flight secondary ion mass spectrometry (ToF-SIMS) to provide additional information on the formation of organometallic complexes, to show the distribution of different species on the surface, and to reveal the temperature-dependent persistence of these species

Sample and Solution Preparation
XPS Measurements
ToF-SIMS Measurements
Results and Discussion
Elemental-Specific Analysis Using XPS
Depth Profiling Using a Gas Cluster Ion Source and Monoatomic Ar
PCA in Conjunction with XPS
Molecular-Specific Analysis Using ToF-SIMS
ToF-SIMS Imaging
Conclusions

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.