Abstract
Bismuth selenide (Bi2Se3), a two-dimensional topological insulator material purchased from Alfa Aesar, was analyzed using in situ x-ray photoelectron spectroscopy (XPS). The XPS spectra obtained from a fresh surface exfoliated in ultrahigh vacuum include a survey scan, high resolution spectra of O 1s, Bi 5d, Se 3d, Bi 4f, Se 3p, Se LMM, C 1s, and the valence band. Quantitative analysis indicates a Se deficient surface composition of Bi2Se2.8, which is consistent with the Fermi level position in the conduction band detected in this work.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
