Abstract
Two-dimensional (2D) microspatial distribution uniformity of photon detection efficiency (PDE) and optical crosstalk probability Pct of multi-pixel photon counters (MPPCs) is studied. The experimental results show that the 2D spatial distribution of Pct is obviously uneven, i.e. Pct is larger at the corners and edges of a single pixel in MPPCs, which suggest a higher electrical field in the depletion region of the pixel at the corners and edges. The nonuniformity of the 2D spatial distribution of PDE also become evident when the size of the pixels of MPPCs is small, which signifies higher nonuniformity of the electric field distribution in MPPCs with small pixel size. A method is proposed for characterization of the 2D electrical field spatial distribution uniformity in a single pixel of MPPCs, which can be used for guiding the optimisation of the fabrication process of MPPCs and their properties. This promising method can naturally be extended to any Geiger avalanche photodiodes (G-APDs) and their arrays.
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