Abstract
We present a dual-axis reflection confocal scanning microscope operating at 2.52 terahertz with axial resolution of 0.67 mm. The spatial resolution of the system was evaluated by utilizing the resolution test chart. Lateral resolution exceeded 0.314 mm, and the lengthwise resolution was over 0.353 mm. We introduced a 0.3 mm pinhole to improve the resolution. Targets such as the Chinese character "TAI" written on paper with a pencil and the metal letter "G" were scanned to test the imaging quality. To verify the imaging ability of the axial sections, two pairs of metal straps and a combinatorial metal ring were scanned, further revealing the satisfying 3D imaging capability.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
