Abstract
This chapter summarizes recent advances in an emerging three-dimensional (3D) imaging technique, transmission electron microtomography (TEMT). As a result of some recent developments in TEMT, it is now possible to obtain ‘truly quantitative’ 3D images of polymer nanostructures with subnanometer resolution. The introduction of scanning optics in TEMT has made it possible to obtain large volumes of 3D data from micrometer-thick polymer specimens using conventional electron microscopes at relatively low acceleration voltage, 200kV. Thus, TEMT covers structures over a wide range of thicknesses from a few nanometers to several hundred nanometers, which corresponds to quite an important spatial range for hierarchical polymer nanostructures. TEMT provides clear 3D images and a wide range of new structural information, which cannot be obtained using other methods, for example, conventional microscopy or scattering methods, can be ‘directly’ evaluated from the 3D volume data.
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