Abstract
In order to investigate the thermal transport properties of strained bismuth telluride thin films, we carried out an electron beam (EB) irradiation to the thin films, and then measured the thermal conductivity by 3ω method. It was found that the crystallinity was dependent upon the EB irradiation dose whereas the crystal orientation of thin films was not affected. The lattice constants of a- and c-axis were shifted slightly with increasing the EB irradiation dose. Finally, The thermal conductivity of thin films was influenced strongly with the EB irradiation but the relationship between the magnitude of thermal conductivity and dose of EB irradiation was not clear yet.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: The Proceedings of the Symposium on Micro-Nano Science and Technology
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
