Abstract
We are pleased to host the 20th ISPS conference and serve as the editors for this Special Issue. This Special Issue is a collection of peer-reviewed, journal quality papers contributed by authors from the 20th ASME Annual Conference on Information Storage and Processing Systems (ISPS) held in Santa Clara University, Santa Clara, California, USA on June 14 and 15, 2010. As the milestone to archive outstanding research and development work presented in the 20th ISPS conference, all authors of papers accepted by the conference were encouraged and invited to submit full paper to this Special Issue in Springer Journal of Microsystem Technologies. Manuscripts submitted to this Special Issue were rigorously reviewed by experts and researchers form universities and industry research and development centers. Out of 117 conference papers presented at the 20th ISPS conference, 85 invitations were made and 75 were submitted to this Special Issue for review. Through the peer-review process, 14 were rejected. Before being accepted and published in this Special Issue, many of the 61 contributions had to be revised substantially. Without doubts, papers published in this Special Issue are special collections of many technical topics presented at the 20th ISPS conference. The 20th ASME ISPS conference is a very unique international conference that brings together academia and industry in joint sessions on research topics that are of interdisciplinary nature. Papers included in this Special Issues were contributed by authors who presented their latest research and development work in following technical sessions at the 20th ISPS conference:
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