Abstract
AbstractA free running electro‐optic sampling system for on wafer characterization of a 65‐nm technology CMOS nonlinear transmission line with the assessment of device performance up to 200 GHz is described. Noise and relative timing jitter between laser and microwave source, as the major limiting factors for the system dynamic range and bandwidth, are studied. Eventually enhancing the system measurement bandwidth using a fast method, and durable against timing jitter, is achieved at the expense of degraded system noise. © 2012 Wiley Periodicals, Inc. Microwave Opt Technol Lett 54:1858–1862, 2012; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.26954
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
