回折格子モノクロメータの高次回折光を利用した2波長域同時分光測定

Abstract

An attempt was made to develop a method to measure simultaneously for twin wavelength regions (from 400 nm to 750 nm and from 700 nm to 2500 nm) using first and second orders diffraction spectra of a grating.The second order diffraction spectrum of a grating, whose first order diffraction spectrum was used for the infrared spectral measurement, was able to be measured precisely for the visible spectrum of light sources.First and second order diffraction spectra of a grating were separated from each other with a cold mirror, so that the visible and infrared spectrum of a light source were able to be measured simultaneously.As a result, visible and infrared spectral measurement was carried out efficiently and precisely with a infrared grating monochromator.