Abstract
This paper presents a new pattern run-length compression method whose decompressor is simple and easy to implement. It encodes 2 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">|</sup> <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">n</i> | runs of compatible or inversely compatible patterns, either inside a single test data segment or across multiple test data segments. Experimental results show that it can achieve an average compression ratio of 67.64% and considerable test application time savings.
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More From: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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