Abstract
Abstract18O oxygen tracer diffusion coefficients and activation energies were determined in polycrystalline PLZT (lead lanthanum zirconate titanate) with varying La concentration in the temperature range of 500 °C to 800 °C. For this purpose the isotope exchange method and Secondary Ion Mass Spectrometry (SIMS) depth profiling were used. As a novel approach a chemically reduced sample was prepared by anneal‐ ing at low oxygen partial pressure (p (O2) ≈ 10–13 Pa). Subsequently the sample was thermally charged with 18O, too. Results indicate a higher diffusion rate in the reduced sample than in as‐received PLZT thus leading to the assumption that the diffusion mechanism in PLZT is vacancy driven despite the strong donor doping of the perovskite lattice. (© 2010 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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