Abstract
Schwarzschild microscope at 18.2nm for diagnostics of hot electron transport in femtosecond laser-plasma interaction has been developed. Based on the third-order aberration theory the microscope is designed for numerical aperture of 0.1 and magnification of 10. Mo/Si multilayer films with peak throughput at 18.2nm is designed and deposited by magnetron sputtering method. The 24lp/mm copper mesh is imaged via Schwarzschild microscope, and resolutions of less than 3μm are measured in 1.2mm field. The diagnostics experiment of hot electron transport is performed on 286 TW SILEX-I laser facilities, and the spatial distribution of radiation caused by hot electron is imaged by Schwarzschild microscope.
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