Abstract
AbstractThe Hong Kong University of Science and Technology, Clear Water Bay, Hong Kong We have performed a systematic characterization of flicker and image retention in silicon light valves. It was found that there were four mechanisms accounting for the flicker and image retention. These four mechanisms were residual DC charge on silicon surface, voltage holding ratio of the LC cell, voltage holding ratio of the silicon panel, and parasitic capacitor coupling. Causes of these mechanisms were identified and solutions for the minimization of flicker were found for each mechanism. Among these solutions, the frame rate multiplication was the most useful for all these four flicker mechanisms.
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