Abstract
The SI-F method is the reasonable damage detection method. In this method, the damages will be detected from the change of correlation between some sensor outputs. Using many sensors, the sensor selection affects on the accuracy of the diagnosis. The sensors that have poor correlation to the other sensors cause the low accuracy diagnosis. The diagnosis of good accuracy is resulted by the best sensor selection. In this paper, the precision of the diagnosis is improved by best sensor selection using t-test on smart structure system using SI-F method.
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