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Abstract
The effect of condensed water on pull-off forces under high vacuum (HV) and 0 to 83 % relative humidity (RH) N_2 atmospheric conditions was evaluated using atomic force microscopy (AFM). The pull-off force was measured between a flat silicon substrate and a flat nickel probe on an AFM cantilever. The flat nickel probe was fabricated by friction-induced wear. Measurement results showed that, with increasing contact time, the pull-off force increased in HV, but decreased in humid 62 and 83 %RH N_2. The pull-off force in HV was lower than that in humid N_2 when the contact time was less than 10 s, but was higher when the contact time was longer than 30 s. Estimated adhesion force based on the Laplace pressure from the contact geometry agreed reasonably well with the measured pull-off force.
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