Abstract
We report on the fabrication and electrical characterization of deep sub-micron (gate length down to 105nm) GeOI pMOSFETs. The Ge layer obtained by hetero-epitaxy on Si wafers has been transferred using the Smart CutTM process to fabricate 200mm GeOI wafers with Ge thickness down to 60–80nm. A full Si MOS compatible pMOSFET process was implemented with HfO2/TiN gate stack. The electrical characterization of the fabricated devices and the systematic analysis of the measured performances (ION, IOFF, transconductance, low field mobility, S, DIBL) demonstrate the potential of pMOSFET on GeOI for advanced technological nodes. The dependence of these parameters have been analyzed with respect to the gate length, showing very good transport properties (μh∼250cm2/V/s, ION=436μA/μm for LG=105nm), and OFF current densities comparable or better than those reported in the literature.
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