Abstract
Thin films of manganite materials (Pr0.7Ca0.3-xSrxMnO3-δ) have been grown, from a sintered target with the same cationic composition, by rf reactive magnetron sputtering. The film and target compositions have been verified as identical, within experimental errors, by energy-dispersive scattering (EDS) analysis. It is shown for the first time, from X-ray and electron diffraction studies, that the films, grown on LaAlO3 or SrTiO3 substrates, are [101] oriented. Nanostructural studies show that the defects are the same as those observed in bulk materials but that the magnetic behavior is different (Curie temperature is decreased from 130 to 50K). From a structural point of view this difference in magnetic behavior is difficult to understand, but the role of the oxygen content, the small grain size observed in such films, and the strains induced by the substrate film interactions is discussed.
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