1 W reliable operation of broad area lasers and 8 W reliable operation of 5 mm wide laser bars at 650 nm

Abstract

Reliability tests for 650 nm broad area lasers and bars with GaInP quantum wells embedded in AlGaInP waveguide layers and n-AlInP and p-AlGaAs cladding layers will be presented. Reliable operation of broad area lasers with 100 μm stripe width at 1.0 W output power over 10,000 h and of 5 mm wide bars with ten 100 μm wide emitters (filling factor 20%) at 8 W over 4,000 h will be reported. 6 mm wide bars with twelve 60 μm wide emitters (filling factor 12%) at 7 W showed a mean time to failure of 3,750 h.