Abstract
We demonstrate high-voltage depletion-mode and enhancement-mode (E-mode) AlGaN/GaN high-electron-mobility transistors (HEMTs) on a GaN-on-silicon-on-insulator (SOI) platform. The GaN-on-SOI wafer features GaN epilayers grown by metal-organic chemical vapor deposition on a p-type (111) Si SOI substrate with a p-type (100) Si handle wafer. Micro-Raman spectroscopy significantly reveals reduced stress in the GaN epilayers, which is a result expected from the compliant SOI substrate. E-mode HEMTs fabricated by fluorine plasma implantation technique deliver high on/off current ratio (10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">8</sup> -10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">9</sup> ), large breakdown voltage (1471 V with floating substrate), and low on-resistance (3.92 mΩ·cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> ).
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