Abstract
Reliability issues of TFT integrated gate driver are still of great concern for large size (i.e. TV) display applications, especially for a-Si:H TFT integrated panels with stressing test of high temperature and high humidity (HTHHO). In this paper, current detection method is proposed for gate driver failure identification. Measurements of 55-inch UHD TV (4K) panel with integrated gate driver are carried out. It is found that gate driver failure after HTHHO are strongly associates with via-hole open of clock bus-lines. It is demonstrated that current through clock lines will be increased with prolonged falling edge due to multi-pulses of gate driver outputs. And clock bus-line open is caused by oxygen of Cu after long operating time during the stressing test.
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