Abstract
Overlayer capping is used as a method to investigate the influence of conduction electrons in FM on the exchange bias system because it should modify the boundary condition of itinerary electrons and this modification should propagate to the FM/AF interface where exchange bias occurs. The Co/FeMn/Cu(001) is taken to investigate the capping effect on exchange bias system. The Cu overlayer is grown in a wedge shape such that the dependence of capping effect on overlayer thickness can be studied exactly on the same exchange bias film. All the thin films are prepared using MBE technique in UHV chamber and all the analysis works , AES, LEED, MEED, and MOKE are done in situ. Since the anti-ferromagnetism of FeMn strongly depends on the alloy concentration, the characterization is important and is done by the quantitative AES analysis and MEED oscillation independently. Coercivity and bias field are taken as the parameters of the capping e ect. The result indicates that the influence of copper overlayer is sensitive to whether the cobalt layer is exchange-biased or not. The role of Co/FeMn interface is discussed and considered as the key factor a ecting the system behavior.
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