Abstract
The impacts of C60 ions on a poly(methyl methacrylate) target in the energy range of 0.12–0.54 MeV were characterized by analysis of negative secondary ion (N-SI) counting data measured using a time-of-flight secondary ion mass spectrometer combined with pulsed primary C60 ion beams in an event-by-event counting mode. Analysis of the counting data was performed to obtain probability distributions of emitted N-SI numbers for one impact and the impact energy dependence of relative emission yields for selected N-SIs species. These emission properties obtained could be qualitatively explained in terms of the characteristics of the emission processes and ion track structures reported for C60 impacts.
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