Abstract
The scattering powers of electron and X-ray differ by 4 - 5 orders of magnitude. Thanks to this property, the electron beam yields high-resolution diffraction spots from undersized crystals of various samples, which are hard to grow to a suitable size for X-ray diffraction even with a high-intensity synchrotron radiation beam. Thus, the technique known as electron 3D crystallography/3D ED/MicroED is recognized as being important especially in synthetic chemistry, material sciences and related areas, while single particle analysis can be used for larger-sized proteins. Here I review this technology including our recent developments and results.
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