Abstract
Magnetoresistive (MR) elements fabricated and investigated for NiFe/Cu multilayers with transverse biasing structures. The magnetoresistive ratio of those elements is about 3.3%, which is 2.5 times as large as that of MR elements of a NiFe single film. The soft-adjacent-layer (SAL) biasing method is available for NiFe/Cu multilayers. The MR ratio decreases with increasing sense current owing to a rise in the temperature of the elements. The MR ratio is maintained in annealing up to 220°C, but rapidly decreases as a result of annealing at 250°C.
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