Abstract
The article deals with forecasting the dependability indicators of state-of-the-art spacecraft onboard equipment. The authors demonstrate the applicability of the results of equipment and components testing for resistance to ionizing radiation in forecasting dependability indicators. They prove the applicability of Alfa distribution of time to failure in forecasting CMOS IC reliability and longevity. The paper presents design ratios for probability evaluation of fail-safe operation, mean time to failure and minimum operation time. Ways are shown to improve the resistance of state-of-the-art spacecraft onboard equipment through the use of specialized means of protection against the effects of ionizing radiation of the outer space. This research (No. 14-05-0038) was conducted with the support of the Higher School of Economics Academic Fund Program in 2014.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
