Abstract
This paper describes a key device for measuring three-dimensional surface profiles using grating projection method. In this system a structured pattern is projected onto the object and the pattern deformed in accordance with the surface shape is captured by a CCD camera. And the captured image is analyzed to get three-dimensional coordinates of the surface on the basis of phase shifting technique. A special grating is built-up which consists of an active-controlled liquid crystal (LC) aligned as stripes. This LC grating has the performances of 4bits gray levels and 50 micrometers of period. Experimental results are gotten by using this LC grating and improved driving method.
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