Abstract
Exchange anisotropy in MnPt(30 nm)/NiFe(5 nm) bilayers was investigated for films grown by the MBE method on SrTiO3(100) substrates at temperatures of Tg = 25°C, 100°C, 200°C, and 300°C. In-situ reflection high-energy electron diffraction observations and ex-situ X-ray diffraction measurements revealed that the MnPt layers grown on NiFe(100) have (100) orientations for Tg = 25°C and 100°C, while they have random orientations for Tg = 200°C and 300°C. Superlattice lines due to the formation of a CuAu-I type ordered structure were observed during the growth of the MnPt layer for all growth temperatures. The (100)-oriented MnPt/NiFe bilayer films were found to have an exchange anisotropy field (Hex) of 220 Oe (corresponding to an exchange anisotropy energy of J = ∼0.09 erg/cm2) and a coercivity (Hc) of ∼ 43 Oe. On the other hand, the films with random orientation showed almost zero Hex and a rather large Hc of ∼ 600 Oe.
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