Abstract
This paper introduces a new device architecture suitable for obtaining a large format, high resolution, and high performance image sensor. Each pixel in the sensor comprises a buried photodiode and a junction field effect transistor, for signal charge generation and amplificaion, respectively. A 1.6 M pixel image sensor was constructed with source follower amplifiers and correlated double sampling circuits for signal readout. The image sensor exhibited high-sensitivity, low-noise, and high-protection capabilities for blooming and smear. The fundamental characteristics-sensitivity of 2 V/lx·s, dynamic range of 75 dB, noise equivalent exposure of 9.2×10-5lx·s, and a dark FPN level of -66 dB were achieved.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: The Journal of the Institute of Image Information and Television Engineers
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
