УРАХУВАННЯ АЛЬТИМЕТРИЧНОЇ ІНФОРМАЦІЇ ПРИ ВИЗНАЧЕННІ РЕЛЬЄФУ ПОВЕРХНІ ПЛАНЕТИ МЕТОДОМ УДОСКОНАЛЕНОЇ ФОТОКЛИНОМЕТРІЇ ЗА ПОЛЕМ НАХИЛІВ

Abstract

Purpose: The paper discusses the possibility for increasing the planet’s surface relief retrieving accuracy with the improved photoclinometry method through the reference of the desired relief to the altimetry data. The general approach to solving the problem is proposed. The use of altimeters having both wide and narrow beam patterns are discussed, but the narrow beam pattern altimeter data is studied more in detail. The spatial resolution of the retrieved relief calculated with the improved photoclinometry method conforms to the one of the source images. Altimetry allows absolute reference to the surface heights and improves the accuracy of the relief determination. Design/metodology/approach: The work is based on the improved photoclinometry method for the planet’s surface relief retrieving from images. This method is mathematically rigorous and uses the Bayesian statistical approach, that allows calculation of the most probable relief according to available observations. Findings: An approach to determining the optimal statistical estimate of the surface heights from images in the frames of the improved photoclinometry method is proposed and an expression for the optimal filter which converts source images along with the wide beam pattern altimetry data into the most probable relief of the planet surface area is presented. The reference technique for the narrow beam pattern altimeter data is formulated. The efficiency of the method has been verified with the computer simulation. The relief of the surface area in Mare Imbrium on the Moon was retrieved using three images and laser altimeter data taken by the “Lunar Reconnaissance Orbiter” spacecraft. Conclusions: Accounting for the narrow beam pattern altimeter data increases the accuracy of the relief determination. Using the narrow beam pattern altimeter data turns out to be more preferable over the involving wide beam pattern altimeter data. Computer simulation has shown that accounting for the narrow beam pattern altimeter data significantly increases the accuracy of the calculated heights as against using images exclusively and helps to speed up the calculation procedure. Key words: planet surface relief; photometry; altimetry; optimal filtering; statistical estimation of random value