Abstract
Perpendicular magnetic recording is expected to be a prominent candidate for ultra-high-density recording at more than 100 Gb/in2. We have developed an analytical method for estimating the read/write performance and thermal decay characteristics. This report focuses discussion on the analysis of low-frequency relaxation process such as hysteresis loops and magnetization decay. The magnetization reversal induced by thermal energy was calculated using Neel-Arrhenius-type model. The calculation conditions which reproduced a practical hysteresis loop could predict the thermal decay characteristics of the written pattern. The accuracy of this estimation is verified by the data from a 52.5 Gb/in2 demonstration, and the specifications for an areal recording density of 100 Gb/in2 is proposed based on this analysis.
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