Abstract
Employing statistical design of experiments, the difference in doping behaviors of rare-earth ions and their effects on the dielectric property and microstructure of <TEX>$BaTiO_3$</TEX>-MgO-<TEX>$MnO_2$</TEX>-(<TEX>$Ba_{0.4}Ca_{0.6}$</TEX>) <TEX>$SiO_3-Re_2O_3$</TEX> (Re = <TEX>$Y_2O_3$</TEX>, <TEX>$Er_2O_3$</TEX>) system were investigated. Through the statistical analysis we have found that the amount of <TEX>$Re_2O_3$</TEX> are significantly affecting on the dielectric properties. The <TEX>$Re_2O_3$</TEX> improved the dielectric constant, dielectric loss and R*C constant, so the appropriate contents of <TEX>$Y_2O_3$</TEX> and <TEX>$Er_2O_3$</TEX> were 0.8 ~ 1.2 mol% and 0.8 ~ 1.3 mol%, respectively. The MLCC(mutilayer chip capacitor) with <TEX>$2.0{\times}1.2{\times}1.2mm$</TEX> size and 475 nF was also suited for X7R with the above composition. It showed that the dielectric constant and RC constant were 2,839 and 3,675 <TEX>${\Omega}F$</TEX>, respectively in the sintering condition at <TEX>$1250^{\c</TEX><TEX>irc}C$</TEX> in <TEX>$Po_2$</TEX> <TEX>$10^{-7}$</TEX> Mpa.
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